electron backscatter diffraction ebsd Search Results


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Electron <t>backscatter</t> <t>diffraction</t> (EBSD) inverse pole figure (IPF) maps of the Co 35 Cr 25 Mn 15 Ni 15 Fe 10 TRIP-HEA hot-compressed at ( a , e , i ) 1123 K, ( b , f , j ) 1173 K, ( c , g , k ) 1223 K, and ( d , h , l ) 1273 K with strain rates of ( a – d ) 0.001 s −1 , ( e – h ) 0.01 s −1 , and ( i – l ) 0.1 s −1 .
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Electron <t>backscatter</t> <t>diffraction</t> (EBSD) inverse pole figure (IPF) maps of the Co 35 Cr 25 Mn 15 Ni 15 Fe 10 TRIP-HEA hot-compressed at ( a , e , i ) 1123 K, ( b , f , j ) 1173 K, ( c , g , k ) 1223 K, and ( d , h , l ) 1273 K with strain rates of ( a – d ) 0.001 s −1 , ( e – h ) 0.01 s −1 , and ( i – l ) 0.1 s −1 .
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Electron <t>backscatter</t> <t>diffraction</t> (EBSD) inverse pole figure (IPF) maps of the Co 35 Cr 25 Mn 15 Ni 15 Fe 10 TRIP-HEA hot-compressed at ( a , e , i ) 1123 K, ( b , f , j ) 1173 K, ( c , g , k ) 1223 K, and ( d , h , l ) 1273 K with strain rates of ( a – d ) 0.001 s −1 , ( e – h ) 0.01 s −1 , and ( i – l ) 0.1 s −1 .
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Electron <t>backscatter</t> <t>diffraction</t> (EBSD) inverse pole figure (IPF) maps of the Co 35 Cr 25 Mn 15 Ni 15 Fe 10 TRIP-HEA hot-compressed at ( a , e , i ) 1123 K, ( b , f , j ) 1173 K, ( c , g , k ) 1223 K, and ( d , h , l ) 1273 K with strain rates of ( a – d ) 0.001 s −1 , ( e – h ) 0.01 s −1 , and ( i – l ) 0.1 s −1 .
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Image Search Results


Electron backscatter diffraction (EBSD) inverse pole figure (IPF) maps of the Co 35 Cr 25 Mn 15 Ni 15 Fe 10 TRIP-HEA hot-compressed at ( a , e , i ) 1123 K, ( b , f , j ) 1173 K, ( c , g , k ) 1223 K, and ( d , h , l ) 1273 K with strain rates of ( a – d ) 0.001 s −1 , ( e – h ) 0.01 s −1 , and ( i – l ) 0.1 s −1 .

Journal: Materials

Article Title: Microstructure Refinement of a Transformation-Induced Plasticity High-Entropy Alloy

doi: 10.3390/ma14051196

Figure Lengend Snippet: Electron backscatter diffraction (EBSD) inverse pole figure (IPF) maps of the Co 35 Cr 25 Mn 15 Ni 15 Fe 10 TRIP-HEA hot-compressed at ( a , e , i ) 1123 K, ( b , f , j ) 1173 K, ( c , g , k ) 1223 K, and ( d , h , l ) 1273 K with strain rates of ( a – d ) 0.001 s −1 , ( e – h ) 0.01 s −1 , and ( i – l ) 0.1 s −1 .

Article Snippet: The microstructures of the compressed samples were characterized using a scanning electron microscope (SEM, Hitachi S-3400N, HITACHI, Tokyo, Japan) equipped with an electron backscatter diffraction (EBSD, OIM Analysis, AMETEK Inc., Berwyn, PA, USA) detector.

Techniques: